Title: Tip Based Near Field Optical Microscopy – Past, Present and Future
Abstract: Near field scanning optical microscopy (NSOM) has evolved into a rich field of study with many different variants over the past 25 years. Following a brief review of the development of this technology, we will go on to discuss the current state of the art. Many different modes of NSOM based on apertureless techniques have evolved such as near-field fluorescence and Tip Enhanced Raman Spectrosocopy (TERS). We present a new modality where optical microscopy is performed by measuring the dipole-dipole interaction force between an optically driven sample and its mirror image in the tip. Photo induced force microscopy is capable of measuring both the linear and non-linear optical response of a sample on the nanoscale. We will present data in the visible and the mid infra-red based on this new technique.
Bio: H. Kumar Wickramasinghe, Ph.D., is a member of the National Academy of Engineering and respected pioneer in nanotechnology. Prior to joining UC Irvine, Wickramasinghe managed nanoscience and technology research at IBM’s Almaden Research Center in San Jose, California. Dr. Wickramasinghe is a fellow of the American Physical Society, and the United Kingdom’s Institute of Physics, Institution of Electrical Engineers (IEE), the Institute of Electrical and Electronics Engineers (IEEE) and the Royal Microscopical Society. He has published over 150 papers.