Title: Uncovering Reliability Issues in Persistent Memory Storage System
Abstract: Non-volatile memory (NVM) technologies, such as byte-addressable persistent memories (PM), are disrupting the storage market. Modern storage systems increasingly use PM for high performance and low energy cost. Nevertheless, building correct PM storage systems is non-trivial due to unique device characteristics. We take a holistic view to analyze persistent memory and host software to understand and improve the overall system robustness.
Bio: Duo Zhang is a final year Ph.D. candidate in ECpE department. His research focuses on non-volatile memory, data-intensive computing and infrastructures, and virtualization. Before coming to Iowa State University, He received a MS degree from Syracuse University.
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